Question Chip IDs of Samsung 860 EVO mSATA 1TB ?

May 12, 2020
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Does anyone of you have the Samsung 860 EVO mSATA 1TB bought from Samsung more or less directly (rather than from eBay or dubious resellers)? If so, I'd be grateful to you if you could post
  • the relevant parts of the S.M.A.R.T. information (e.g., parts output via smartctl) showing the chipset identifiers and
  • if you managed to take a look below the paper sheet covering the front side of the SSD, the chip-model identifiers (rather than the serial numbers) printed on the chips themselves.
Don't take a look at the front cover of the packaging, as it contains exactly the same photo for all sizes (250 GB — 1TB).
Thanks in advance,
Md
 
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This is the 2.5" SATA version (from GSmartControl):

Code:
smartctl 6.6 2017-11-05 r4594 [i686-w64-mingw32-w10-b18363] (sf-6.6-1)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Device Model:     Samsung SSD 860 EVO 1TB
Serial Number:    S3YBN**********
LU WWN Device Id: 5 002538 *********
Firmware Version: RVT04B6Q
User Capacity:    1,000,203,804,160 bytes [1.00 TB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    Solid State Device
Form Factor:      2.5 inches
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is:  SATA 3.2, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is:    Thu Jun 04 16:34:59 2020 AUSEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is:   Unavailable
APM feature is:   Unavailable
Rd look-ahead is: Enabled
Write cache is:   Enabled
DSN feature is:   Unavailable
ATA Security is:  Disabled, frozen [SEC2]

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)    Offline data collection activity
                    was never started.
                    Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)    The previous self-test routine completed
                    without error or no self-test has ever
                    been run.
Total time to complete Offline
data collection:         (    0) seconds.
Offline data collection
capabilities:              (0x53) SMART execute Offline immediate.
                    Auto Offline data collection on/off support.
                    Suspend Offline collection upon new
                    command.
                    No Offline surface scan supported.
                    Self-test supported.
                    No Conveyance Self-test supported.
                    Selective Self-test supported.
SMART capabilities:            (0x0003)    Saves SMART data before entering
                    power-saving mode.
                    Supports SMART auto save timer.
Error logging capability:        (0x01)    Error logging supported.
                    General Purpose Logging supported.
Short self-test routine
recommended polling time:      (   2) minutes.
Extended self-test routine
recommended polling time:      (  85) minutes.
SCT capabilities:            (0x003d)    SCT Status supported.
                    SCT Error Recovery Control supported.
                    SCT Feature Control supported.
                    SCT Data Table supported.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAGS    VALUE WORST THRESH FAIL RAW_VALUE
  5 Reallocated_Sector_Ct   PO--CK   100   100   010    -    0
  9 Power_On_Hours          -O--CK   099   099   000    -    208
12 Power_Cycle_Count       -O--CK   099   099   000    -    21
177 Wear_Leveling_Count     PO--C-   100   100   000    -    0
179 Used_Rsvd_Blk_Cnt_Tot   PO--C-   100   100   010    -    0
181 Program_Fail_Cnt_Total  -O--CK   100   100   010    -    0
182 Erase_Fail_Count_Total  -O--CK   100   100   010    -    0
183 Runtime_Bad_Block       PO--C-   100   100   010    -    0
187 Reported_Uncorrect      -O--CK   100   100   000    -    0
190 Airflow_Temperature_Cel -O--CK   075   061   000    -    25
195 Hardware_ECC_Recovered  -O-RC-   200   200   000    -    0
199 UDMA_CRC_Error_Count    -OSRCK   100   100   000    -    0
235 Unknown_Attribute       -O--C-   099   099   000    -    14
241 Total_LBAs_Written      -O--CK   099   099   000    -    400863524
                            ||||||_ K auto-keep
                            |||||__ C event count
                            ||||___ R error rate
                            |||____ S speed/performance
                            ||_____ O updated online
                            |______ P prefailure warning

General Purpose Log Directory Version 1
SMART           Log Directory Version 1 [multi-sector log support]
Address    Access  R/W   Size  Description
0x00       GPL,SL  R/O      1  Log Directory
0x01           SL  R/O      1  Summary SMART error log
0x02           SL  R/O      1  Comprehensive SMART error log
0x03       GPL     R/O      1  Ext. Comprehensive SMART error log
0x04       GPL,SL  R/O      8  Device Statistics log
0x06           SL  R/O      1  SMART self-test log
0x07       GPL     R/O      1  Extended self-test log
0x09           SL  R/W      1  Selective self-test log
0x10       GPL     R/O      1  NCQ Command Error log
0x11       GPL     R/O      1  SATA Phy Event Counters log
0x13       GPL     R/O      1  SATA NCQ Send and Receive log
0x30       GPL,SL  R/O      9  IDENTIFY DEVICE data log
0x80-0x9f  GPL,SL  R/W     16  Host vendor specific log
0xa1           SL  VS      16  Device vendor specific log
0xa5           SL  VS      16  Device vendor specific log
0xce           SL  VS      16  Device vendor specific log
0xe0       GPL,SL  R/W      1  SCT Command/Status
0xe1       GPL,SL  R/W      1  SCT Data Transfer

SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged

SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged.  [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1
SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Read SCT Status failed: Input/output error

Read SCT Status failed: Input/output error
SCT (Get) Error Recovery Control command failed

Device Statistics (GP Log 0x04)
Page  Offset Size        Value Flags Description
0x01  =====  =               =  ===  == General Statistics (rev 1) ==
0x01  0x008  4              21  ---  Lifetime Power-On Resets
0x01  0x010  4             208  ---  Power-on Hours
0x01  0x018  6       400863524  ---  Logical Sectors Written
0x01  0x020  6         3597835  ---  Number of Write Commands
0x01  0x028  6      2131170359  ---  Logical Sectors Read
0x01  0x030  6        12581341  ---  Number of Read Commands
0x01  0x038  6         1030000  ---  Date and Time TimeStamp
0x04  =====  =               =  ===  == General Errors Statistics (rev 1) ==
0x04  0x008  4               0  ---  Number of Reported Uncorrectable Errors
0x04  0x010  4               0  ---  Resets Between Cmd Acceptance and Completion
0x05  =====  =               =  ===  == Temperature Statistics (rev 1) ==
0x05  0x008  1              25  ---  Current Temperature
0x05  0x020  1              40  ---  Highest Temperature
0x05  0x028  1              22  ---  Lowest Temperature
0x05  0x058  1              70  ---  Specified Maximum Operating Temperature
0x06  =====  =               =  ===  == Transport Statistics (rev 1) ==
0x06  0x008  4             235  ---  Number of Hardware Resets
0x06  0x010  4               0  ---  Number of ASR Events
0x06  0x018  4               0  ---  Number of Interface CRC Errors
0x07  =====  =               =  ===  == Solid State Device Statistics (rev 1) ==
0x07  0x008  1               0  N--  Percentage Used Endurance Indicator
                                |||_ C monitored condition met
                                ||__ D supports DSN
                                |___ N normalized value

SATA Phy Event Counters (GP Log 0x11)
ID      Size     Value  Description
0x0001  2            0  Command failed due to ICRC error
0x0002  2            0  R_ERR response for data FIS
0x0003  2            0  R_ERR response for device-to-host data FIS
0x0004  2            0  R_ERR response for host-to-device data FIS
0x0005  2            0  R_ERR response for non-data FIS
0x0006  2            0  R_ERR response for device-to-host non-data FIS
0x0007  2            0  R_ERR response for host-to-device non-data FIS
0x0008  2            0  Device-to-host non-data FIS retries
0x0009  2            3  Transition from drive PhyRdy to drive PhyNRdy
0x000a  2            3  Device-to-host register FISes sent due to a COMRESET
0x000b  2            0  CRC errors within host-to-device FIS
0x000d  2            0  Non-CRC errors within host-to-device FIS
0x000f  2            0  R_ERR response for host-to-device data FIS, CRC
0x0010  2            0  R_ERR response for host-to-device data FIS, non-CRC
0x0012  2            0  R_ERR response for host-to-device non-data FIS, CRC
0x0013  2            0  R_ERR response for host-to-device non-data FIS, non-CRC
 
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Maxxify

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I don't own the 860 EVO in any form factor and the IDs can vary on capacity but the flash ID on that should be K9DMGY8SCC, the DRAM should be 8Gbit (1GB) which would be K4P8G304EQ, the controller (MEX) would be S4LN045X01. The 850 EVO famously came with multiple controllers, multiple generations of flash, and of course the DRAM varies with capacity. The MGX controller would be S4LN062X01 instead (MHX was 52X01), flash will start with K9D/K90 either way and still be GY8 but could end S7C, different DRAM is also possible.
 

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