Question Crucial BX500 conflicting SMART data ?

Mar 8, 2022
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Hi !
I bought a second-hand, but new Crucial BX500 2TB SSD and used it for almost 20000 hours in a mostly read-only environment.
I take a look from time to time on its SMART data and something seems to be a little off since some attributes do not match with each other.
I've put full smart log from today and an older one from two years ago

root@server1:/media/data# smartctl -a /dev/sda
smartctl 6.6 2016-05-31 r4324 [x86_64-linux-5.0.0-32-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke

=== START OF INFORMATION SECTION ===
Model Family: Crucial/Micron Client SSDs
Device Model: CT2000BX500SSD1
Serial Number: 1943E224BF7E
LU WWN Device Id: 5 00a075 1e224bf7e
Firmware Version: M6CR030
User Capacity: 2.000.398.934.016 bytes [2,00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-3 T13/2161-D revision 4
SATA Version is: SATA >3.2 (0x1ff), 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Tue Mar 8 10:37:41 2022 EET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x11) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 100 100 000 Pre-fail Always - 0
5 Reallocate_NAND_Blk_Cnt 0x0032 086 086 010 Old_age Always - 1
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 19547
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 136
171 Program_Fail_Count 0x0032 100 100 000 Old_age Always - 0
172 Erase_Fail_Count 0x0032 100 100 000 Old_age Always - 1
173 Ave_Block-Erase_Count 0x0032 099 099 000 Old_age Always - 18
174 Unexpect_Power_Loss_Ct 0x0032 100 100 000 Old_age Always - 112
180 Unused_Reserve_NAND_Blk 0x0033 100 100 000 Pre-fail Always - 6
183 SATA_Interfac_Downshift 0x0032 100 100 000 Old_age Always - 0
184 Error_Correction_Count 0x0032 100 100 000 Old_age Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
194 Temperature_Celsius 0x0022 070 041 000 Old_age Always - 30 (Min/Max 15/59)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 1
197 Current_Pending_ECC_Cnt 0x0032 100 100 000 Old_age Always - 1
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 5
202 Percent_Lifetime_Remain 0x0030 099 099 001 Old_age Offline - 1
206 Write_Error_Rate 0x000e 100 100 000 Old_age Always - 0
210 Success_RAIN_Recov_Cnt 0x0032 100 100 000 Old_age Always - 0
246 Total_LBAs_Written 0x0032 100 100 000 Old_age Always - 21505563370
247 Host_Program_Page_Count 0x0032 100 100 000 Old_age Always - 672048855
248 FTL_Program_Page_Count 0x0032 100 100 000 Old_age Always - 1301398656
249 Unkn_CrucialMicron_Attr 0x0032 100 100 000 Old_age Always - 0
250 Read_Error_Retry_Rate 0x0032 100 100 000 Old_age Always - 5593539
251 Unkn_CrucialMicron_Attr 0x0032 100 100 000 Old_age Always - 0
252 Unkn_CrucialMicron_Attr 0x0032 100 100 000 Old_age Always - 1
253 Unkn_CrucialMicron_Attr 0x0032 100 100 000 Old_age Always - 239
254 Unkn_CrucialMicron_Attr 0x0032 100 100 000 Old_age Always - 601
223 Unkn_CrucialMicron_Attr 0x0032 100 100 000 Old_age Always - 25

SMART Error Log Version: 1
Warning: ATA error count 0 inconsistent with error log pointer 1

ATA Error Count: 0
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh🇲🇲SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 0 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 00 00 00 e0 Error: ICRC, ABRT at LBA = 0x00000000 = 0

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 28 b8 8f ab e0 00 00:00:00.000 READ DMA EXT
25 00 28 68 3c 4c e0 00 00:00:00.000 READ DMA EXT
b0 d0 01 00 4f c2 00 00 00:00:00.000 SMART READ DATA
b0 d5 01 06 4f c2 00 00 00:00:00.000 SMART READ LOG
b0 d5 01 01 4f c2 00 00 00:00:00.000 SMART READ LOG

Error -1 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 00 00 00 e0 Error: ICRC, ABRT at LBA = 0x00000000 = 0

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 20 40 29 0e e0 00 00:00:00.000 READ DMA EXT
b0 d0 01 00 4f c2 00 00 00:00:00.000 SMART READ DATA
25 00 a0 a0 7b 0e e0 00 00:00:00.000 READ DMA EXT
b0 d5 01 06 4f c2 00 00 00:00:00.000 SMART READ LOG
b0 d5 01 01 4f c2 00 00 00:00:00.000 SMART READ LOG

Error -2 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 00 00 00 e0 Error: ICRC, ABRT at LBA = 0x00000000 = 0

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 20 c0 43 de e0 00 00:00:00.000 READ DMA EXT
25 00 20 00 97 b0 e0 00 00:00:00.000 READ DMA EXT
25 00 20 40 d3 79 e0 00 00:00:00.000 READ DMA EXT
35 00 18 38 d0 8f e0 00 00:00:00.000 WRITE DMA EXT
25 00 20 80 95 b0 e0 00 00:00:00.000 READ DMA EXT

Error -3 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 00 00 00 e0 Error: ICRC, ABRT at LBA = 0x00000000 = 0

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 df f8 de 80 00 00 00 00:00:00.000 WRITE FPDMA QUEUED
60 20 00 c8 a3 b1 00 00 00:00:00.000 READ FPDMA QUEUED
60 20 00 c8 a3 b1 00 00 00:00:00.000 READ FPDMA QUEUED
60 20 00 c8 a3 b1 00 00 00:00:00.000 READ FPDMA QUEUED
60 20 00 c8 a3 b1 00 00 00:00:00.000 READ FPDMA QUEUED

Error -4 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 00 00 00 00 Error: ABRT

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d0 01 00 4f c2 00 08 00:00:00.000 SMART READ DATA
b0 d1 01 01 4f c2 00 08 00:00:00.000 SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
b0 d5 01 06 4f c2 00 08 00:00:00.000 SMART READ LOG
ec 00 01 00 00 00 00 08 00:00:00.000 IDENTIFY DEVICE
ec 00 01 00 00 00 00 08 00:00:00.000 IDENTIFY DEVICE

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 13413 -
# 2 Extended offline Completed without error 00% 11837 -
# 3 Extended offline Completed without error 00% 6723 -
# 4 Short offline Completed without error 00% 4 -

Selective Self-tests/Logging not supported

root@server1:/media/data# cat /media/data/smartctl_data/20200603.txt
1 Raw_Read_Error_Rate 0x002f 100 100 000 Pre-fail Always - 0
5 Reallocated_Sector_Ct 0x0032 100 100 010 Old_age Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 4957
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 54
171 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
172 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
173 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 8
174 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 52
180 Unused_Rsvd_Blk_Cnt_Tot 0x0033 100 100 000 Pre-fail Always - 7
183 Runtime_Bad_Block 0x0032 100 100 000 Old_age Always - 0
184 End-to-End_Error 0x0032 100 100 000 Old_age Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
194 Temperature_Celsius 0x0022 065 046 000 Old_age Always - 35 (Min/Max 15/54)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 5
202 Unknown_SSD_Attribute 0x0030 100 100 001 Old_age Offline - 0
206 Unknown_SSD_Attribute 0x000e 100 100 000 Old_age Always - 0
210 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
246 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 8845339482
247 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 276416858
248 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 499909248
249 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
250 Read_Error_Retry_Rate 0x0032 100 100 000 Old_age Always - 1638945
251 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
252 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
253 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 64
254 Unknown_SSD_Attribute 0x0032 100 100 000 Old_age Always - 417
223 Unknown_SSD_Attribute 0x0032 100 100 000 Old_age Always - 25

What is not matching is attribute 180 and 202.
Attribute 180, from crucial site, says that when it reaches 0, disk becomes read-only but attribute 202 should be percent remaining or percent used and its value increased from 0 to 1 over 20000 hours/10TB written to it so it seems to mean that it is percent used.
On the other hand, attribute 180 decreased from 7 to 6 over these 10TB written/20000 hours.
So my questions are if the smart data was somehow modified and if I should worry about the disk SSD failing.

Thanks,
Adi
 
Reallocate_NAND_Blk_Cnt (attribute 5) has increased from 0 to 1. This is telling you that the SSD has developed one grown defect.

Unused_Reserve_NAND_Blk (attribute 180) has decreased from 7 to 6. This is confirming that one spare block has been used to replace the defective block.

I don't know what the raw value of attribute 202 is telling us for this model. However, some other SSDs report 1 or 0 depending on whether the remaining lifetime is being calculated on the basis of bad blocks or the number of PE cycles. That is, these other SSDs use the raw value to indicate which parameter is being used to assess the remaining lifetime.
 
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