There was a detailed discussion about the development history of SAQP (4x) process. It was invented by neither Intel nor SiCarrier/Huawei, and we should not get it confused with two patents recently filed (and widely reported) by SiCarrier and Huawei . The patent reported in this article (and covered by Bloomberg as well before) was filed by SiCarrier but doesn't seem to be production worthy to me (e.g., for BEOL). A more aggressive & practical patterning patent: SASP(7x) filed by Huawei was just disclosed in this year's SPIE Advanced Lihtography + Patterning. This SASP(7x) process incorporates selfa-aligned vias & cuts, can potentially drive metal pitch down to ~12nm (about 1nm logic node) with acceptable yield. The comment attached below is from SemiWiki (slightly revised) and very helpful for us to understand more details about this critical semiconductor technology competition between two nations:
First single-material SAQP paper was published by AMAT in 2011 SPIE Adavanced Lithography, but they didn't apply for a patent. So it has been globally used in FEOL fin patterning for free. The refined dual-material SAQP process to use etching selectivity to solve the EPE issue, however, to my knowledge was invented in 2015 and patented by Peking University in 2017 (US patent: 9679771 B1). I guess Intel used it to at least fabricate N10 M1 (see TechInsights report), but Intel did not pay for it, for which PKU was discussing a law solution! There are two (also called) “SAQP” patents that are very hot in the media recently. But it's easy to have both of them confused with the SAQP process already clearly defined by our chip industry. First one is the SiCarrier SAQP variant (CN117080054 A) which is quite normal (not production worthy) and will not be discussed here; the other one is from HiSilicon (CN 117751427 A), which extended 2x SALELE to 4x SALELELE..., its problem is that it requires too many masks (7-8), and the yield may be close to 0! The critical issue is not density multiplication such as 2x or 4x, it is the very small cuts/blocks and vias (12-16nm) that need to be self-aligned, otherwise they will miscut/mis-connect the wrong metal lines. The real production worthy process is another patent also filed by HiSilicon: a SASP(7x) SAVC technology which can drive down metal pitch to 12nm (about 1nm logic node). This process incorporates self-aligned vias & cuts, and metal-layer division to decouple the power rails from signal wires (WIPO patent application # CN2022/097621). Details of this patent was just disclosed in the paper titled "Mandrel/spacer engineering based patterning and metallization incorporating metal layer division and rigorously self-aligned vias & cuts (SAVC)” in 2024SPIE Advanced Lithography+Patterning.